2019

2.  Structural and electronic optimization of ring-graphene cathodes and their field emission properties

        Xiuyuan Shao, Wei Kean Ang, Pranesh Balamuniappan, Anjam Khursheed

       Appl. Phys. Lett. 114, 223101 (2019); https://doi.org/10.1063/1.5097676

3.  Electron optical characterization of a graphene coated nickel electron source 

        Xiuyuan Shao, Wei Kean Ang, Anjam Khursheed

       Journal of Electron Spectroscopy and Related Phenomena (2019)https://doi.org/10.1016/j.elspec.2019.06.002

4.  A corrector structure and a method for correcting aberration of an annular focused charged-particle beam

        Anjam Khursheed

       US Patent App. 16/097,479, 2019

2018

1.  A high-brightness large-diameter graphene coated point cathode field emission electron source

        Xiuyuan Shao, Avinash Srinivasan, Wei Kean Ang, Anjam Khursheed

       Nature communications 9 (1), 1288 (2018); https://doi.org/10.1038/s41467-018-03721-y

2.  A Review Paper on “Graphene Field Emission for Electron Microscopy”

        Xiuyuan Shao, Anjam Khursheed

       Applied Sciences 8 (6), 868 (2018); https://doi.org/10.3390/app8060868

3.  Secondary Electron Energy Contrast of Localized Buried Charge in Metal–Insulator–Silicon Structures

        Avinash Srinivasan, Weiding Han, Anjam Khursheed

       Microscopy and Microanalysis 24 (5), 453-460 (2018); https://doi.org/10.1017/S1431927618015052

2017

1.  Aberration correction apparatus, device having the same, and method for correcting aberration of charged particles

        Anjam Khursheed

       US Patent 9,601,304(2017)

2.  Fabrication and development of high brightness nano-aperture ion source

        Xinxin Xu, Rudy Pang, P Santhana Raman, Rajasekaran Mariappan, Anjam Khursheed, Jeroen A van Kan

       Microelectronic Engineering 174, 20-23 (2017), https://doi.org/10.1016/j.mee.2016.12.009

3.  Design considerations for a compact proton beam writing system aiming for fast sub-10 nm direct write lithography

        Xinxin Xu, Nannan Liu, P Santhana Raman, Sarfraz Qureshi, Rudy Pang, Anjam Khursheed, Jeroen A van Kan

       Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and

       Atoms 404, 243-249 (2017), https://doi.org/10.1016/j.nimb.2016.12.031

4.  Performance test of high brightness nano-aperture ion source

        Xinxin Xu, P Santhana Raman, Rudy Pang, Nannan Liu, Anjam Khursheed, Jeroen A van Kan

       Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and                   Atoms 404, 52-57 (2017), https://doi.org/10.1016/j.nimb.2017.01.051

2016

1.  Brightness measurement of an electron impact gas ion source for proton beam writing applications

        N Liu, X Xu, R Pang, P Santhana Raman, A Khursheed, JA van Kan

       Review of Scientific Instruments 87 (2), 02A903 (2016), https://doi.org/10.1063/1.4932005

2.  Annular focused electron/ion beams for combining high spatial resolution with high probe current

        Anjam Khursheed, Wei Kean Ang

       Microscopy and Microanalysis 22 (5), 948-954 (2016), https://doi.org/10.1017/S1431927616011594

3.  A few-layer graphene ring-cathode field emitter for focused electron/ion beam applications

        Xiuyuan Shao, Avinash Srinivasan, Yunshan Zhao, Anjam Khursheed

       Carbon 110, 378-383 (2016), https://doi.org/10.1016/j.carbon.2016.09.048

2015

1.  Development of ion sources: towards high brightness for proton beam writing applications

        Nannan Liu, P Santhana Raman, Xinxin Xu, Huei Ming Tan, Anjam Khursheed, Jeroen A van Kan

       Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and                   Atoms 348, 23-28 (2015), https://doi.org/10.1016/j.nimb.2015.01.017

 

2.  On-axis electrode aberration correctors for scanning electron/ion microscopes

        A Khursheed, WK Ang

       Microscopy and Microanalysis 21 (S4), 106-111 (2015), https://doi.org/10.1017/S1431927615013227

3.  Energy analyzer attachments for the scanning electron microscope

        A Khursheed

       Microscopy and Microanalysis 21 (S4), 130-135 (2015), https://doi.org/10.1017/S1431927615013264

4.  First Experiments Using a Radial Mirror Analyzer Attachment Prototype for Scanning Electron Microscopes

        Avinash Srinivasan, Anjam Khursheed

       Microscopy and Microanalysis 21 (S4), 136-141 (2015), https://doi.org/10.1017/S1431927615013276

5.  A parallel radial mirror energy analyzer attachment for the scanning electron microscope

        Kang Hao Cheong, Weiding Han, Anjam Khursheed, Karuppiah Nelliyan

       Microscopy and Microanalysis 21 (S4), 142-147 (2015), DOI: https://doi.org/10.1017/S1431927615013288

 

6. Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy

    Analyzer Inside a Scanning Electron Microscope

        Avinash Srinivasan, Anjam Khursheed

       Microscopy and Microanalysis 21 (4), 910-918 (2015), DOI: https://doi.org/10.1017/S1431927615013525

 

8.  Gun configured to generate charged particles

        Anjam Khursheed

       US Patent 9,093,243

 

1.  Beyond conventional secondary electron imaging using spectromicroscopy and its applications in dopant profiling

        Weiding Han, Avinash Srinivasan, Amit Banerjee, Matthew Chew, Anjam Khursheed

       Materials Today Advances 2 (2019) 100012; https://doi.org/10.1016/j.mtadv.2019.100012

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